Patyra, Marek: search on Z-Library

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1

Technological centering—An experimental approach to VLSI ICs yield maximization

Marek J. Patyra, Jan Zabrodzki

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 699 KB

english, 1989

2

Optimized carry lookahead adders with direct feeding

Marek J. Patyra, Yi Sun, Clark Thomborson

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 702 KB

english, 1996

3

Design of ICs applying built-in current testing

Wojciech Maly, Marek Patyra

Journal:

Journal of Electronic Testing

Year:

1992

Language:

english

File:

PDF, 828 KB

english, 1992

4

The scaled-down circuit yield improvement by technological centering

Marek J. Patyra, Jan Zabrodzki

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 547 KB

english, 1990

5

Hardware implementations of digital fuzzy logic controllers

Marek J. Patyra, Janos L. Grantner

Journal:

Information Sciences

Year:

1999

Language:

english

File:

PDF, 1.59 MB

english, 1999

6

Impact of Local Interconnects on Timing and Power in a High Performance Microprocessor

Shelar, Rupesh S., Patyra, Marek

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 1.92 MB

english, 2013

7

Embedded Deterministic Test Points

Acero, Cesar, Feltham, Derek, Liu, Yingdi, Moghaddam, Elham, Mukherjee, Nilanjan, Patyra, Marek, Rajski, Janusz, Reddy, Sudhakar M., Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 2.97 MB

english, 2017

8

Incidence of Spinal Perineurial (Tarlov) Cysts among East-European Patients

Burdan, Franciszek, Mocarska, Agnieszka, Janczarek, Marzena, Klepacz, Robert, Łosicki, Marek, Patyra, Krzysztof, Brodzik, Agnieszka, Kiszka, Joanna, Chruścicka, Aneta, Żelzowska-Cieślińska, Iwonna, St

Journal:

Year:

2013

Language:

english

File:

PDF, 2.83 MB

english, 2013

9

A degenerated fuzzy-number processing system based on artificial neural networks

Marek J. Patyra, Taek Mu Kwon

Journal:

Information Sciences

Year:

1995

Language:

english

File:

PDF, 724 KB

english, 1995

10

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Embedded deterministic test points for compact cell-aware tests

Acero, Cesar, Feltham, Derek, Hapke, Friedrich, Moghaddam, Elham, Mukherjee, Nilanjan, Neerkundar, Vidya, Patyra, Marek, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2015

Language:

english

File:

PDF, 1.09 MB

english, 2015

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